Cerium Laboratories LLC
Independent analytical laboratory focused on materials characterization and contamination analysis for semiconductor and advanced materials industries. Services include trace metal and organic contaminant testing, surface and microstructure analysis, ion-beam depth profiling, and advanced materials R&D support. The laboratory holds ISO/IEC 17025 accreditation for multiple test methods.
Industries
N/A
Services
Analytical testing services
Trace metal, organic, surface, thin-film and microstructure analyses for semiconductor and advanced materials customers.
Advanced materials research and characterization support
Composition analysis, dopant profiling, microstructure characterization and surface analysis to support R&D and product development.
Manufacturing support and raw materials qualification
Analytical qualification of raw materials and contamination control support to improve yield and reduce process variation.
LIMS-based sample tracking and client data access
Online laboratory information management system for sample submission, tracking and data retrieval.
Analytical testing services
Trace metal, organic, surface, thin-film and microstructure analyses for semiconductor and advanced materials customers.
Advanced materials research and characterization support
Composition analysis, dopant profiling, microstructure characterization and surface analysis to support R&D and product development.
Manufacturing support and raw materials qualification
Analytical qualification of raw materials and contamination control support to improve yield and reduce process variation.
LIMS-based sample tracking and client data access
Online laboratory information management system for sample submission, tracking and data retrieval.
Expertise Areas
- Materials characterization
- Surface and near-surface analysis
- Trace metals analysis
- Organic contamination and VOC analysis
Key Technologies
- High-resolution ICP-MS
- VPD-ICP-MS (wafer surface extraction)
- ATD-GC-MS
- ICP-OES