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government (1)

SKUZA, Jonathan R. (1)

Rosenberg, Steven A. (71)

Dimitrov, Dimiter S. (63)

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Showing 1 Patents

X-ray diffraction (XRD) characterization methods for sigma=3 twin defects in cubic semiconductor (100) wafers

05-12-2017 • US-9835570-B2

PARK, YEONJOON • KIM, HYUN JUNG • SKUZA, JONATHAN R. • LEE, KUNIK • KING, GLEN C. • CHOI, SANG HYOUK

National Aeronautics and Space Administration NASA

government (1)

SKUZA, Jonathan R. (1)

Rosenberg, Steven A. (71)

Dimitrov, Dimiter S. (63)

National Aeronautics and Space Administration NASA (1)

B2 (1)

2017 (1)

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