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organizations (0)

solicitations (0)

patents (2)

Owner

government (2)

Inventors

Orloff, Nathan Daniel (2)Rosenberg, Steven A. (71)Dimitrov, Dimiter S. (63)

Assignee

United States Department of Commerce (2)National Institute of Standards and Technology NIST (1)

Patent Type

B2 (2)

Publication Year

2019 (1)2022 (1)

Showing 2 Patents

Scanning microwave ellipsometer and performing scanning microwave ellipsometry

29-03-2022 • US-11287366-B2

LONG, CHRISTIAN JOHN • ORLOFF, NATHAN DANIEL • BASTA, NINA POPOVIC • GARBOCZI, EDWARD JOSEPH

United States Department of Commerce

Noncontact resonameter, process for making and use of same

16-04-2019 • US-10261032-B2

ORLOFF, NATHAN DANIEL • LONG, CHRISTIAN JOHN • OBRZUT, JAN

National Institute of Standards and Technology NIST • United States Department of Commerce

Owner

government (2)

Inventors

Orloff, Nathan Daniel (2)Rosenberg, Steven A. (71)Dimitrov, Dimiter S. (63)

Assignee

United States Department of Commerce (2)National Institute of Standards and Technology NIST (1)

Patent Type

B2 (2)

Publication Year

2019 (1)2022 (1)

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