Ambient sampling mass spectrometry and chemometric analysis for screening encapsulated electronic and electrical components for counterfeits
Inventors
Hieftje, Gary M. • Ray, Steven J. • PFEUFFER, Kevin P. • Shelley, Jacob T. • Caldwell, Norris J.
Assignees
Indiana University Research and Technology Corp • US Department of Navy
Publication Number
US-9607306-B2
Publication Date
2017-03-28
Expiration Date
2035-03-18
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Abstract
A method and apparatus for identification of a counterfeit electronic component, subjecting a suspected counterfeit electronic to an analytical method of ambient surface analysis to desorb and ionize compounds directly from a suspected counterfeit electronic surface with no pretreatment, detecting the resultant ions, comparing the identified ions to known standards, and returning a confidence that the suspected counterfeit electronic being analyzed is counterfeit.
Core Innovation
The invention provides a method and apparatus for identification of counterfeit electronic components by subjecting a suspected counterfeit electronic to an ambient desorption/ionization (ADI) source to energize compounds at the surface of the component without any pretreatment. The energized compounds are detected, for example by generating a mass spectrum of ions resulting from the compounds at the surface, and these detected properties are compared to known standards using chemometric methods such as principal component analysis (PCA) and the bootstrapped error-adjusted single sample technique (BEAST). This comparison returns a confidence level indicating whether the suspected electronic is counterfeit.
The problem being solved addresses the widespread issue of counterfeit electronics present in commercial and military supply chains, which complicates tracking and verification due to diffuse distributors and long service times. Current detection methods like visual inspection, solvent testing, and various advanced microscopy and X-ray techniques are time-consuming, expensive, require skilled operators, and often cannot perform rapid, real-time screening. There is thus a need for rapid, reliable analytical methodologies that enable nearly real-time sampling and analysis of component surfaces to detect counterfeits such as blacktopped integrated circuits.
Claims Coverage
The patent contains three independent claims encompassing methods and apparatuses for identifying counterfeit electronics using ambient desorption/ionization mass spectrometry and chemometric analysis.
Identification of counterfeit electronics using ambient desorption/ionization without pretreatment
A method comprising subjecting a suspected counterfeit electronic to an ambient desorption/ionization source under atmospheric pressure to energize surface compounds without pretreatment, detecting properties of these compounds at the surface (e.g., generating a mass spectrum), and comparing these properties to a standard to identify counterfeit status.
Analysis of suspected counterfeit integrated circuits via mass spectrometry and chemometric methods
A method comprising subjecting a suspected counterfeit integrated circuit to an ambient desorption/ionization source under atmospheric pressure, generating a mass spectrum of ions from surface compounds, and comparing the mass spectrum to a standard using chemometric methods such as principal component analysis (PCA), bootstrapped error-adjusted single sample technique (BEAST), or a combination thereof.
Apparatus for counterfeit electronic identification using ambient desorption/ionization and mass spectrometry
An apparatus comprising an ambient desorption/ionization source to desorb and ionize compounds directly from a suspected counterfeit electronic surface under atmospheric pressure with no pretreatment, a mass spectrometry detector coupled to the ADI source to detect ions resulting from the surface, and at least one programmable machine programmed to compare detected ions to a standard via chemometric methods and return a confidence level whether the analyzed electronic is counterfeit.
The independent claims cover both methods and apparatuses focusing on the use of ambient desorption/ionization mass spectrometry without pretreatment combined with chemometric analysis to rapidly identify counterfeit electronics, particularly integrated circuits altered by blacktopping, by comparing mass spectral or spectroscopic data of surface compounds to known genuine standards and returning a confidence measure of authenticity.
Stated Advantages
Reduced analysis times by eliminating the need for sample pretreatment, enabling rapid screening (e.g., under 10 to 60 seconds per sample).
Limiting the requirement for highly skilled operators by automating identification and statistical analysis through chemometrics, removing subjective judgment and human bias.
Providing statistical confidence levels regarding whether a chip is genuine or counterfeit, improving decision-making accuracy.
Flexibility and general applicability to different methods of counterfeiting beyond previously identified markers, as chemometrics analyze entire spectral fingerprints rather than specific peaks.
Documented Applications
Screening of encapsulated electronic components, specifically integrated circuits, to detect counterfeit parts subjected to blacktopping relabeling.
Use in supply chains and consumer-parts communities, including military and commercial applications, where rapid, reliable counterfeit detection is critical.
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