Analyte test strip and analyte meter device
Inventors
Iyengar, Sridhar • Harding, Ian • Boiteau, Charles • Butters, Collin
Assignees
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Publication Number
US-9244000-B2
Publication Date
2016-01-26
Expiration Date
Abstract
A test strip with an incorporated optical waveguide and deflectors punched through the optical waveguide allows light to exit through a layer of the test strip and be detected by a photo detector. Using light and a photodetector, these uniquely coded strips are identified. The waveguide can be constructed by sandwiching two layers of the test strip around a light transmissible layer. This configuration allows light to be transmitted through the test strip and out the other end, as well as allowing some light to escape the deflector. This light is detected by a photodetector mounted in the analyte test meter. The deflectors may be placed in patterns such that detection of this light indicates certain characteristics of the strip, such as non-counterfeit, regional identification, type of analyte tested, and coding information.
Core Innovation
The disclosed electrochemical test strip includes an optical waveguide extending from a first end toward a second end, and a deflector formed in or on the waveguide so that light traveling along the waveguide is deflected and exits the waveguide between the first end and second end. In some constructions, light is emitted from the waveguide at the second end, while aligned deflectors and reflective material direct light back through multiple deflectors.
In other constructions, deflectors include a deflector punched through the optical waveguide so that light exiting the waveguide exits through an edge of the test strip, or apertures formed through the waveguide between the first and second ends deflecting light to exit through the apertures. The strip and meter combinations further encode strip characteristics using spatial and intensity information associated with the deflectors and/or apertures.
In the disclosed method, light is directed into the waveguide of the test strip and deflected light exiting the waveguide is detected. The detected light is correlated with a characteristic of the electrochemical test strip, including regional identification, calibration information, analyte type, strip alignment, brand information, manufacturer information, and counterfeit information.
Claims Coverage
The provided independent claims cover four main aspects: optical detection of deflected light and correlation with a strip characteristic, an elongated test strip architecture with a waveguide and deflector, aligned deflectors with reflective material to direct light back through deflectors, and apertures through a waveguide with detection of location and intensity of deflected light. Across these independent claims, the main inventive features include waveguide-based deflection and optical readout, structural arrangements of deflectors and apertures relative to strip ends and electrochemical test cells, and correlation of detected optical signals with encoded strip characteristics or analyte-related information.
Deflecting light exiting a waveguide for correlation with a strip characteristic
An electrochemical test strip is provided with an electrical connector at a first end, an electrochemical test cell at a second opposite end, a waveguide extending from the first end towards the second end, and a deflector formed in or on the waveguide, suitable for deflecting at least a portion of light traveling along the waveguide so that the deflected light exits the waveguide between the first end and second end of the strip; light is directed into the waveguide, deflected light exiting the waveguide is detected, and the detected light is correlated with a characteristic.
Elongated test strip with waveguide deflector causing mid-strip light exit
An elongated test strip comprising an electrical connector at a first end, an electrochemical test cell at a second opposite end, a waveguide extending from the first end towards the second end, and a deflector formed in or on the waveguide, wherein the deflector is suitable for deflecting at least a portion of light traveling along the waveguide so that the deflected light exits the waveguide between the first end and second end of the strip.
Aligned first, second, and third deflectors with reflective material directing light back through deflectors
An elongated test strip comprising a first deflector surface and a second deflector surface with an optical waveguide disposed between the first and second deflector surfaces extending from a first end towards a second end, a strip port connector disposed at the first end, and an electrochemical test cell disposed at the second end, wherein a first deflector is formed in the optical waveguide, a second deflector is formed in the first deflector surface and a second deflector is formed in the second deflector surface, the first, second, and third deflectors are aligned, the deflectors are not contiguous with the electrochemical cell, and reflective material is placed over the second deflector such that light is directed back through the first, second, and third deflectors.
Detecting location and intensity of deflected light through waveguide apertures to determine strip characteristic
A method for determining a characteristic of an electrochemical test strip comprising providing a test strip with an electrical connector with a plurality of electrical contact areas disposed at a first end, an electrochemical test cell, a waveguide extending from the first end towards a second end, and a plurality of apertures formed through the waveguide between the first and second ends that deflect a portion of light traveling along the waveguide so that the deflected light exits the test strip through the apertures with at least one aperture of different size than another; directing light into the waveguide and detecting the location and intensity of the deflected light exiting the test strip through the apertures; and determining a characteristic of the electrochemical test strip from the deflected light detected.
Combination of test strip and test meter with photogenerator/photodetector for deflected-light pathway
A combination of a test strip and a test meter wherein the test strip comprises an electrical connector at a first end, an electrochemical test cell at a second opposite end, a waveguide extending from the first end towards the second end, and a deflector formed in or on the waveguide such that the deflected light exits the waveguide between the first end and second end of the strip; and the test meter comprises a strip port connector for interaction with the electrical connector of the test strip, electronics to determine an amount of an analyte in a sample applied to the electrochemical test cell, and a photogenerator contained in the analyte test meter to generate and direct light into the first end of the waveguide, and a photodetector for detecting deflected light exiting the waveguide, with the first end of the test strip disposed in the strip port connector of the test meter.
Across the independent claims, the coverage centers on optical encoding and readout using a waveguide with deflectors, including aligned deflectors with reflective material or apertures formed through the waveguide, detection of deflected light using a light source or photogenerator and photodetector, and correlation or determination of a characteristic of the electrochemical test strip from the detected light, optionally integrated with electronics that determine an amount of an analyte.
Stated Advantages
Not explicitly described in patent.
Documented Applications
Not explicitly described in patent.
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