Methods of performing a sizing analysis using a corrected sizing ladder
Inventors
CAMPORESE, DAN • Bhatt, Advit • Molho, Josh • Xu, Hui • Summers, Ken
Assignees
Interested in licensing this patent?
MTEC can help explore whether this patent might be available for licensing for your application.
Publication Number
US-9012206-B2
Publication Date
2015-04-21
Expiration Date
Abstract
The invention provides methods of performing a sizing analysis. In the methods, a sizing ladder used in performing the sizing analysis is corrected. In one method, the sizing ladder is corrected for batch-to-batch variations in a sieving gel. In another method, the sizing ladder is corrected for a sample concentration that is different from the archival sizing ladder concentration. Methods are also provided in which the sizing ladder is corrected using a standard marker in a sample and/or using a real-time standard sizing ladder. The methods may be used individually or in combination.
Core Innovation
The invention relates to a method of performing a sizing analysis by using a corrected archival sizing ladder in a fractionation device. An archival sizing ladder is provided that includes previously measured archival ladder migration times, and the method performs sizing analysis by comparing separated components to the corrected ladder.
The method is carried out in a separation channel of the fractionation device using a sample containing a low standard marker. The sample is separated into a plurality of separated components, and the low standard marker is detected to provide a low standard marker migration time.
The low standard marker migration time is aligned with the corresponding archival sizing ladder migration time, thereby providing a corrected archival sizing ladder. The corrected archival sizing ladder is then used to perform the sizing analysis of the separated components in comparison with a parameter for at least one of the separated components, selected from separated component migration time and separated component band position.
Claims Coverage
The document provides one independent claim that covers performing sizing analysis using a corrected archival sizing ladder obtained by detecting and aligning a low standard marker migration time to archival ladder migration times, followed by sizing analysis compared using separated component migration time and/or separated component band position.
Providing an archival sizing ladder and separating in a fractionation device
providing an archival sizing ladder, the archival sizing ladder including previously measured archival ladder migration times; loading a separation channel of a fractionation device with a sample containing a low standard marker; separating the sample into a plurality of separated components
Detecting the low standard marker and aligning to create a corrected archival sizing ladder
detecting the low standard marker, thereby providing a low standard marker migration time; aligning the low standard marker migration time with the corresponding archival sizing ladder migration time, thereby providing a corrected archival sizing ladder
Performing sizing analysis using the corrected archival sizing ladder
performing a sizing analysis of the separated components using the corrected archival sizing ladder in comparison with a parameter for at least one of the separated components, the parameter being selected from the group consisting of separated component migration time and separated component band position
Overall, the independent claim centers on creating a corrected archival sizing ladder by detecting a low standard marker migration time and aligning it to previously measured archival ladder migration times, then using the corrected ladder to compare separated components via migration time and/or band position for sizing analysis.
Stated Advantages
Documented Applications
No documented applications found
Interested in licensing this patent?