Dark-field microscopy imaging apparatus
Inventors
Liu, Mingzhao • Haupt, Justine E. • Deane, Connie-Rose Mai • Gang, Oleg
Assignees
US Department of Energy • Columbia University in the City of New York • Brookhaven Science Associates LLC
Publication Number
US-12379326-B2
Publication Date
2025-08-05
Expiration Date
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Abstract
An apparatus includes a main body, circuit assembly, lens, and clamping assembly. The main body includes an aperture that receives a wafer configured to receive a sample under study. The main body is configured to support the circuit assembly, which includes illumination sources that emit light of different colors such that total internal reflection is generated in the wafer. The main body is configured to provide support for the lens, and the clamping assembly mechanically coupled to the main body such that the lens is selectively positionable with respect to a camera lens. A microscopy imaging apparatus includes an illumination source, wafer, and charge-coupled device. The illumination source is configured to emit white light such that total internal reflection is generated in the wafer. The sample under study is disposed between the wafer and the charge coupled device, and the charge coupled device is configured to obtain an image of the sample under study upon illumination of the wafer by the illumination source.
Core Innovation
A dark-field microscopy imaging apparatus includes a main body, circuit assembly, lens, and clamping assembly. The main body includes an aperture configured to receive a wafer, and the wafer is configured to receive a sample under study. The circuit assembly includes illumination sources that emit light of different colors such that total internal reflection is generated in the wafer, and the main body is configured to provide support for the lens and to support the circuit assembly. The clamping assembly is mechanically coupled to the main body such that the lens is selectively positionable with respect to a camera lens.
A microscopy imaging apparatus embodiment includes an illumination source, wafer, and charge-coupled device where the illumination source is configured to emit white light such that total internal reflection is generated in the wafer, and the sample under study is disposed between the wafer and the charge coupled device so the charge coupled device is configured to obtain an image of the sample upon illumination of the wafer. The background identifies that conventional smart device-based microscopy is generally limited to bright-field imaging and that dark-field imaging typically requires unique illumination techniques because small, weakly scattering features have low refractive contrast against a background and ambient light cannot resolve such features. The disclosed apparatus generates TIR-guided light and an evanescent field that interacts with the specimen under study so that outwardly scattered light is collected for dark-field imaging.
Claims Coverage
Independent claims identified: two independent claims (claim 1 apparatus; claim 11 method). Six main inventive features are extracted from these independent claims.
Main body with aperture for wafer
a main body, the main body comprising an aperture, the aperture configured to receive a wafer, the wafer configured to receive a sample under study
Circuit assembly with multi-color illumination generating TIR
a circuit assembly, the main body configured to support the circuit assembly, the circuit assembly comprising illumination sources that emit light of different colors such that a total internal reflection is generated in the wafer
Lens supported by the main body
a lens, the main body configured to provide support for the lens
Clamping assembly for selective lens positioning
a clamping assembly, the clamping assembly mechanically coupled to the main body such that the lens is selectively positionable with respect to a camera lens
Side-coupled illumination with propagation and homogenization
wherein emitted light is configured to enter the wafer from at least one side thereof, and to propagate and homogenize throughout the wafer
Method of dark-field microscopy with wafer in main body
receiving a wafer in an aperture of a main body; supporting a circuit assembly using the main body; emitting light of different colors by illumination sources such that a total internal reflection is generated in the wafer; supporting a lens using the main body; and mechanically coupling a clamping assembly to the main body such that the lens is selectively positionable with respect to a camera lens
The independent apparatus claim (claim 1) centers on a main body with an aperture for a wafer, a circuit assembly providing multi-color illumination to generate total internal reflection in the wafer, a supported lens, and a clamping assembly to position the lens relative to a camera lens with side-coupled illumination that propagates and homogenizes in the wafer. The independent method claim (claim 11) corresponds to receiving the wafer in the main body, supporting the circuit assembly and lens, emitting multi-color illumination to generate TIR, and mechanically coupling a clamping assembly to enable selective positioning relative to a camera lens.
Stated Advantages
Universal adaptability to a wide variety of smart devices via the clamping assembly and slider assembly enabling alignment in at least two dimensions.
Minimization of light scattering and loss through wafer side geometry (e.g., slanted sides) and use of light guides to more efficiently contain light within the wafer.
Substantial enhancement of signal-to-noise ratio of the object to be imaged by optimizing total internal reflection conditions and reducing parasitic scattering.
Ability to spectrally image and count a large number of nanoparticles or virus-induced clusters, thereby substantially improving diagnostic accuracy and precision.
Provision of home and/or point-of-care testing with the rapid speed of antigen testing and a substantial improvement in sensitivity (ability to detect concentrations approximately 1,000–10,000 times less than antigen testing as described).
Documented Applications
Attachment to smart devices (e.g., smart phones, tablets) for dark-field microscopy imaging using the smart device camera and flashlight.
Use with printed circuit board (PCB) cameras as an alternative to smart device cameras.
Large-volume diagnostic testing in laboratory settings, enabling spectral imaging and counting of nanoparticles or virus-induced clusters.
Home and point-of-care testing for viral diagnostics (illustrated with a representative COVID-19 example).
Spectral imaging and counting of nanoparticles and virus-induced clusters to improve diagnostic accuracy and precision.
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