Support for test device
Inventors
Hunter, Christopher • Davis, Steven • Sher, Melissa • Vanhoute, David
Assignees
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Publication Number
US-12337326-B2
Publication Date
2025-06-24
Expiration Date
Abstract
A support holder for a test device is disclosed, wherein the holder may include a base having a first plurality of sidewalls having a first length and a second plurality of sidewalls having a second length, wherein the second length is greater than the first length, wherein the plurality of sidewalls define a cavity in the base, the cavity including a surface for receiving a portion of the test device; and a plurality of projections extending away from the base, wherein each projection of the plurality of projections is configured to be associated with a leg portion, and wherein a first sidewall of the first plurality of sidewalls includes a center notch positioned between a first corner portion and a second corner portion, and wherein a second sidewall of the first plurality of sidewalls includes a removable portion configured to cover an opening into an interior of the base.
Core Innovation
A support holder is provided for holding a test device, and the support holder includes a base with a first plurality of sidewalls and a second plurality of sidewalls. The first sidewall includes a first corner, a second corner, and a center notch positioned between the first corner and the second corner, and the second sidewall includes a movable portion configured to selectively cover the opening into the interior of the base in a closed state or to expose the opening into the interior of the base in an open state.
A cavity is formed in the base and includes a surface configured to receive at least a portion of the test device. A plurality of projections is formed integrally with the base and extends away from the base, where each projection includes a housing, a leg, and a neck disposed between the base and the housing.
One or more air vents are provided to facilitate cooling of the test device when in use. In certain configurations, the cavity is in fluid communication with the one or more air vents to facilitate cooling, and the support holder includes features intended to maintain the test device temperature during long tests.
Claims Coverage
The provided material contains two independent claims. Across the independent claims, there are three main inventive aspects: a base and cavity receiving arrangement, integrally formed projections with housing, leg, and neck geometry, and cooling via one or more air vents.
Base with sidewalls, opening, center notch, and selectively covering movable portion
A base having a first plurality of sidewalls and a second plurality of sidewalls defining an opening into an interior of the base; the first sidewall including a first corner, a second corner and a center notch positioned between the first corner and the second corner; and the second sidewall including a movable portion configured to selectively cover the opening in a closed state or expose the opening in an open state.
Cavity with surface configured to receive the test device
A cavity formed in the base including a surface configured to receive at least a portion of the test device.
Integrally formed projections with housing, leg, and neck
A plurality of projections formed integrally with the base and extending away from the base, each projection including a housing, a leg, and a neck disposed between the base and the housing.
One or more air vents configured to facilitate cooling
One or more air vents configured to facilitate cooling of the test device when in use.
The independent claims cover a support holder that receives a test device in a base cavity, uses integrally formed projections having housing, leg, and neck geometry, and includes cooling facilitated by one or more air vents.
Stated Advantages
Facilitates cooling of the test device when in use.
Maintains the test device temperature during long tests.
Documented Applications
Use with a test device in a support holder configuration, including DNA/RNA sequencers such as the MinION during long tests.
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