Use of clean and dry gas for particle removal and assembly therefor

Inventors

Higgins, RichFLATON, Ken

Assignees

Rapid Micro Biosystems Inc

Interested in licensing this patent?

MTEC can help explore whether this patent might be available for licensing for your application.

Publication Number

US-12121842-B2

Patent

Publication Date

2024-10-22

Expiration Date


Abstract

The invention features particle removal assemblies and methods for removing dust and other debris from a sample container, e.g., to improve counting colonies of microorganisms (e.g., bacteria, fungi, or protists) present in environmental, pharmaceutical, biological, and other samples. An assembly of the invention includes components for particle removal, e.g., a filter, a dryer, a flow controller, and an outlet. The invention also provides methods of detecting samples after cleaning a sample container with clean and/or dry gas.

Core Innovation

The invention relates to a particle removal assembly for use with microbial sample containers prior to imaging and colony counting, where clean and dry gas is used to remove dust and debris. The assembly includes a filter configured to remove particulate matter from a gas, a dryer, a flow controller, and an outlet that is a blow-off nozzle. The filter, dryer, flow controller, and outlet are connected in series to allow gas to flow through the filter, dryer, and outlet, and the flow controller controls the rate of flow through the outlet.

The assembly further includes a reservoir for storage of the gas, provided upstream of the outlet and downstream of the filter and dryer. The document describes configuring the gas after filtration and drying by specifying particle and contaminant limits, including particle concentration limits by size range, a vapor pressure dew point limit, and a total oil limit. The intent is to reduce false positives by conditioning the gas so that dust and liquid contributions are minimized during exposure of the sample container surface.

The invention is described as compatible with automated imaging devices for microbial enumeration, including systems with an imager and optionally an incubator. In an example, short-duration clean/dry gas pulses are used in a workflow where the assembly removes particles from a surface of a sample container and the sample is then imaged to detect colonies. The document states that using the conditioned clean/dry gas in the specified imaging workflow reduces false positives in the imager-based colony counting system.

Claims Coverage

One independent claim is identified. The claim covers an assembly with five core elements—filter, dryer, flow controller, blow-off nozzle outlet, and an upstream/downstream reservoir arrangement—connected in series so that conditioned gas is delivered through the nozzle with controlled flow rate. Dependent claims refine the assembly by defining specific filter and dryer types and by specifying quantitative gas-conditioning targets after filtration and drying.

Particle removal assembly with series-connected filter, dryer, flow controller, and blow-off nozzle

A particle removal assembly comprising: a filter configured to remove particulate matter from a gas; a dryer; a flow controller; an outlet, wherein the outlet is a blow-off nozzle; and a reservoir for storage of the gas, wherein the filter, dryer, flow controller, and outlet are connected in series to allow the gas to flow through the filter, dryer, and outlet; the flow controller controls the rate of flow through the outlet; and the reservoir is provided upstream of the outlet and downstream of the filter and dryer.

Post-conditioning total oil limitation

The claim defines that, after the gas passes through the filter and a dryer, the gas has a total oil amount of ≤40.1 mg/m³.

Post-conditioning size-segregated particle count limits

The claim covers an assembly in which, after the gas passes through a filter and a dryer, the gas contains no more than 90,000 particles/m³ of 0.5–1 µm and no more than 1000 particles/m³ of 1–5 µm.

Filter selection from specified filter technologies

The claim covers an assembly in which the filter is chosen from specified filter types including fiber, polymer, paper, metal mesh, membrane-based, activated carbon, an electrostatic precipitator, or combinations thereof.

Dryer selection from specified dryer classes

The claim defines an assembly in which the dryer is chosen from evaporative dryers, membrane dryers, absorption dryers, adsorption dryers, or combinations thereof.

Colony detection workflow using the particle removal assembly prior to imaging

A method detects colonies by actuating the assembly to remove particles from a surface of a sample container containing the sample and then imaging the sample in the container.

Across the independent claim and its refinements described in the document, the core inventive concept is delivering conditioned gas to a blow-off nozzle via a series-connected filter, dryer, and flow controller, with a reservoir located upstream of the nozzle and downstream of filtration/drying. Refinements specify quantitative post-conditioning particle/oil limits, select specific filter and dryer types, and use the assembly in a colony-detection workflow where particle removal is performed before imaging.

Stated Advantages

Reduces false positives in the imager-based colony counting system by using clean/dry gas conditioning prior to imaging.

Documented Applications

Particle removal prior to imaging and microbial enumeration/colony counting using automated imaging devices (including a GROWTHDIRECT® system) with an imager and optionally an incubator.

A method for detecting colonies by removing particles from a surface of a sample container and then imaging the sample in the container.

JOIN OUR MAILING LIST

Stay Connected with MTEC

Keep up with active and upcoming solicitations, MTEC news and other valuable information.