Method and system of producing a plurality of analytical test strips

Inventors

Detloff, AndreasHumbek, EgonLetkemann, Artur

Assignees

Roche Diagnostics GmbHRoche Diagnostics Operations Inc

Interested in licensing this patent?

MTEC can help explore whether this patent might be available for licensing for your application.

Publication Number

US-12103287-B2

Patent

Publication Date

2024-10-01

Expiration Date


Abstract

A method of producing a plurality of analytical test strips using a reel-to-reel process, comprising providing at least one continuous first layer web, having disposed on a first side at least one first electrode layer, the first layer web having a first layer edge; continuously disposing at least one continuous spacer layer web onto the first side of the first layer web, wherein the spacer layer web has a spacer layer edge, wherein the disposing is position-controlled in a master-slave fashion by using a position of the first layer edge as a master position and a position of the spacer layer edge as a slave position; and continuously disposing at least one continuous second layer web onto the spacer layer web, the second layer web having disposed on a first side at least one second electrode layer, wherein the second layer web has a second layer edge.

Core Innovation

The disclosure relates to manufacturing multilayer analytical, in particular electrochemical, test strips by a reel-to-reel process with position-controlled lamination of electrode-containing layers and a spacer layer. A continuous first electrode-containing layer web is laminated, and a spacer-layer web is laminated in a position-controlled manner such that the spacer-layer edge is offset from the first layer edge.

The process uses master-slave control using the first layer edge as master for controlling the spacer-layer edge, and a second electrode-containing layer web is then laminated on the spacer layer with its layer edge aligned to the first layer edge using master-slave control where the second layer edge is controlled as slave. The disclosure further enables high-precision edge alignment using downstream alignment sensing and correction.

Inline sensor types for alignment sensing include optical distance sensors, infrared sensors, laser profile sensors, and ultrasound sensors. The disclosure also includes creation of a sample application zone formed by the spacer between uncovered electrode portions with tight tolerance, together with fault detection and marking/disposal, and electrostatic discharge to prevent charging in the sample zone.

Claims Coverage

Not explicitly described in patent.

Not explicitly described in patent.

Stated Advantages

Not explicitly described in patent.

Documented Applications

Manufacturing multilayer analytical, in particular electrochemical, test strips, including formation of a sample application zone with a spacer between uncovered electrode portions.

JOIN OUR MAILING LIST

Stay Connected with MTEC

Keep up with active and upcoming solicitations, MTEC news and other valuable information.