Infra-red spectroscopy system
Inventors
Baker, Matthew J. • Hegarty, Mark • Butler, Holly Jean • Palmer, David
Assignees
Interested in licensing this patent?
MTEC can help explore whether this patent might be available for licensing for your application.
Publication Number
US-11668646-B2
Publication Date
2023-06-06
Expiration Date
Abstract
A sample slide (100) for use in a spectrometer (501), wherein the sample slide comprises a plurality of sample-receiving portions (111-114) provided on a sample side (115) of the slide, and a plurality of beam-receiving portions (121-124) provided on a beam-receiving side (125) of the slide, each beam-receiving portion being arranged opposite a respective sample-receiving portion, and wherein each beam-receiving portion is configured to act as an internal reflection element (IRE). A device (300) for use with a spectrometer (501) comprises a stage (330) configured to receive a sample slide (100); and a moving mechanism (360) configured to move the sample slide relative to a sample-measuring location (320) of the device. Associated methods for preparing a sample and measuring a sample are also disclosed.
Core Innovation
The invention provides a slide for IR spectral analysis, where a sample-receiving portion is provided on a sample side of a slide and a beam-receiving portion is provided on a beam side of the slide. The beam-receiving portion is arranged opposite the sample-receiving portion and comprises an internal reflection element (IRE). The slide thickness between the beam-receiving portion and the opposite sample-receiving portion is selected from 380 µm and 675 µm.
The disclosed slide architecture supports IR/ATR-FTIR spectroscopy by using engineered beam-receiving structures, where the IRE is provided on the beam side opposite the sample-receiving portion. The disclosure emphasizes a multiwell/multiplex sample slide concept in which each beam-receiving portion functions as an IRE opposite a sample-receiving portion. Structural groove/prism features are described to obtain spectral performance with improved signal-to-noise, while specific thickness selections are used to set the geometry between beam and sample sides.
A spectrometer accessory/device is disclosed that includes an optical compartment and a movable stage driven by a motor that shifts the slide to sequentially measure multiple wells without removing, cleaning, or drying the IRE between measurements. In addition, a method is disclosed for preparing one or more samples for IR spectral analysis by drying samples on such a slide at approximately 30–36 °C and/or under a gas flow rate of at least 50 m3/h, with the slide having the sample-receiving portion, beam-receiving portion with an IRE, and the thickness selected from 380 µm and 675 µm.
Claims Coverage
The partial content includes two independent claims. Across these claims, the coverage centers on a specific slide geometry defining opposed sample-receiving and beam-receiving portions with an IRE and selected thickness, and a sample-preparation drying method performed on that slide using specified drying temperature and gas flow conditions.
Opposed sample-receiving and beam-receiving portions with an IRE
A slide comprising a sample-receiving portion provided on a sample side of a slide and a beam-receiving portion provided on a beam side of the slide, the beam-receiving portion being arranged opposite the sample-receiving portion and comprising an internal reflection element (IRE).
Selected slide thickness between beam-receiving and sample-receiving portions
A slide wherein a thickness between the beam-receiving portion and the opposite sample-receiving portion is selected from 380 µm and 675 µm.
Drying one or more samples on a slide with defined IRE geometry
A method of preparing a sample for IR spectral analysis comprising drying one or more samples on a slide at approximately 30–36 °C and/or under a gas flow rate of at least 50 m3/h, wherein the slide comprises a sample-receiving portion, a beam-receiving portion on a beam side arranged opposite the sample-receiving portion and comprising an internal reflection element (IRE), and a thickness between the beam-receiving portion and the opposite sample-receiving portion selected from 380 µm and 675 µm.
Overall, claim coverage is anchored by a slide that places an IRE-bearing beam-receiving portion opposite a sample-receiving portion with thickness limited to 380 µm or 675 µm, and by a method that dries samples at approximately 30–36 °C and/or under gas flow of at least 50 m3/h on such a slide for IR spectral analysis.
Stated Advantages
Improved spectral reproducibility/sharpness, including improved water/OH and amide I peaks, after drying.
Unexpected improvement in spectral reproducibility/sharpness compared with earlier performance as described in the disclosure.
Documented Applications
Serum for cancer classification using PCA, including examples associated with glioblastoma multiforme (GBM) and melanoma.
Bacteria family/genus discrimination using ATR-FTIR spectral analysis.
Interested in licensing this patent?