Imaging systems with angled sensors and related methods

Inventors

Lee, Justin • Liu, Hsiou-Yuan • Yonjan, Bikram • Yu, Bo Yang • Zhang, Yibo

Assignees

Path Ai Inc • PathAI Inc

Abstract

Diffraction-based imaging systems are described. Aspects of the technology relate to imaging systems having one or more sensors inclined at angles with respect to a sample plane. In some cases, multiple sensors may be used that are, or are not, inclined at angles. The imaging systems may have no optical lenses and are capable of reconstructing microscopic images of large sample areas from diffraction patterns recorded by the one or more sensors. Some embodiments may reduce mechanical complexity of a diffraction-based imaging system. A diffractive imaging system comprises a light source, a sample support configured to hold a sample along a first plane, and a first sensor comprising a plurality of pixels disposed in a second plane that is tilted at an inclined angle relative to the first plane. The first sensor is arranged to record diffraction images of the light source from the sample.

Core Innovation

The invention is a diffractive imaging system in which a first sensor comprising a plurality of pixels is disposed in a second plane that is tilted at an inclined angle relative to a first plane holding a sample. The first sensor records diffraction images of the light source from the sample, and a mechanism varies a relative lateral position of the first sensor with respect to the sample support in a direction that is approximately parallel to the first plane. Lens-free operation is also described, including configurations with no lenses between the sample support and the first sensor.

The invention further provides an acquisition device that partitions diffraction image data from the sensor into a plurality of groups corresponding to different sections of the sensor. An image for a same portion of the sample is determined based on first diffraction image data from a first section and second diffraction image data from a second section different from the first section. The acquisition device compensates for the angle when computing an in-focus image for the sample.

In related system-level and method-level implementations, the invention reconstructs a microscopic image of a portion of the sample using portions of diffraction patterns recorded at different sensor lateral positions. A second diffraction pattern is recorded subsequent to varying the lateral position, and reconstruction uses a first portion of the first diffraction pattern and a second portion of the second diffraction pattern recorded by different portions of the sensor. The document also describes implementations that incorporate sensor tilt compensation during in-focus image computation and may include additional sensor planes and reconstructed outputs such as super-resolution diffraction images.

Claims Coverage

The partial content includes four independent claims. Across these claims, the coverage repeatedly includes a tilted pixel sensor relative to a sample plane and diffraction-image recording of a light source through the sample, with further scope for sensor lateral-position variation, lenslessness, and angle-compensated reconstruction from partitioned diffraction data.

Across the independent claims, the core claim coverage centers on recording diffraction images using a tilted pixel-array sensor relative to the sample plane, varying the sensor laterally approximately parallel to the sample plane, and reconstructing microscopic or in-focus images by combining or partitioning diffraction data while compensating for the sensor angle. Additional claim scope explicitly includes lensless configurations with no lenses between the sample support and the first sensor.

Stated Advantages

Documented Applications