Adaptive sensing based on depth

Inventors

LESHEM, BenSMALL, EranHayut, ItaiNa'aman, ErezBEN-BASSAT, Eyal

Assignees

Scopio Labs Ltd

Interested in licensing this patent?

MTEC can help explore whether this patent might be available for licensing for your application.

Publication Number

US-11482021-B2

Patent

Publication Date

2022-10-25

Expiration Date


Abstract

A microscope for adaptive sensing may comprise an illumination assembly, an image capture device configured to collect light from a sample illuminated by the assembly, and a processor. The processor may be configured to execute instructions which cause the microscope to capture, using the image capture device, an initial image set of the sample, identify, in response to the initial image set, an attribute of the sample, determine, in response to identifying the attribute, a three-dimensional (3D) process for sensing the sample, and generate, using the determined 3D process, an output image set comprising more than one focal plane. Various other methods, systems, and computer-readable media are also disclosed.

Core Innovation

The document describes a microscope that uses a processor to perform adaptive sensing based on the sample depth or structure inferred from an initial image set. The microscope includes an illumination assembly and an image capture device for collecting light from the sample. The processor first causes capture of an initial image set of the sample using the image capture device.

After capturing the initial image set, the processor identifies an attribute of the sample by performing analysis on the initial image set independently from a user. The attribute is indicative of the sample extending beyond a single focal plane. In response to identifying this attribute, the processor determines a three-dimensional (3D) process by determining, using the attribute, that the sample extends beyond the single focal plane and selecting the 3D process from a plurality of 3D processes capable of capturing the sample with more than one focal plane.

Using the determined 3D process, the processor generates an output image set comprising the more than one focal plane. The document further refines how the attribute is identified, including thickness at one or more locations and expanded visual, structural, and optical parameters, and how the 3D process is carried out by selecting from multiple computational sensing modalities such as focus stacking, 2.5D reconstruction, and 3D reconstruction from subsets of images.

Claims Coverage

The independent claim describes a microscope with an adaptive sensing workflow that includes initial image capture, independent attribute identification indicative of extension beyond a single focal plane, selection of a 3D process from a plurality of 3D processes, and generation of an output image set comprising more than one focal plane. Dependent claims further specify the attribute content and the selected 3D process modality and constraints.

Adaptive 3D process selection based on sample extension beyond a single focal plane

A microscope in which the processor captures an initial image set, independently identifies an attribute of the sample from the initial image set that is indicative of the sample extending beyond a single focal plane, determines a 3D process by selecting from a plurality of 3D processes capable of capturing the sample with more than one focal plane, and generates an output image set comprising the more than one focal plane.

Independent attribute identification indicating extension beyond a single focal plane

The processor performs analysis on the initial image set independently from a user to identify an attribute of the sample that is indicative of the sample extending beyond a single focal plane.

Output image set with more than one focal plane using a determined 3D process

The microscope determines a 3D process based on the identified attribute and generates, using the determined 3D process, an output image set comprising the more than one focal plane.

Attribute includes thickness of the sample at one or more locations

The measured attribute includes the thickness of the sample at one or more locations.

Attribute determined using specified structural, optical, and visual parameter analysis modalities

The attribute includes one or more specified visual, structural, and optical parameters and is determined using at least one of color analysis, optical aberration analysis, computational reconstruction, pattern recognition, Fourier transformation, or light field analysis.

3D process executed within a threshold time

The microscope performs the 3D process within a threshold time from capturing the initial image set.

3D imaging using multiple distances with more focal planes than distances

A 3D imaging process in which images are captured at a plurality of distances between the image capture device and the sample, with the number of focal planes being greater than the number of those distances.

3D process includes focus stacking using at least a subset of images

The 3D process performs focus stacking on a sample using at least a subset of images captured by the image capture device.

Overall, claim coverage focuses on adaptive sensing: capturing an initial image set, independently identifying a sample attribute indicative of extension beyond a single focal plane, selecting a 3D process from multiple options capable of producing an output image set with more than one focal plane, and generating that output. Dependent claims further specify attribute definitions, timing constraints, relationships between captured distances and focal plane count, and specific 3D process modalities such as focus stacking.

Stated Advantages

Not explicitly described in patent.

Documented Applications

Not explicitly described in patent.

JOIN OUR MAILING LIST

Stay Connected with MTEC

Keep up with active and upcoming solicitations, MTEC news and other valuable information.