Test element analysis system for the analytical examination of a sample
Inventors
Fischheiter, Lars • Stein, Reiner • Goebel, Martin
Assignees
B&w Engineering und Datensysteme GmbH • Roche Diagnostics GmbH • Roche Diagnostics Operations Inc
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Publication Number
US-11391676-B2
Publication Date
2022-07-19
Expiration Date
Abstract
A test element analysis system for analytical examination of a sample. The system comprises a measurement device, which comprises a test element receptacle for receiving at least one test element at least partially, wherein the receptacle comprises at least one first and at least one second part, wherein the first part comprises at least one support surface for placement of the test element, wherein the second part comprises at least one optical detector for detecting at least one detection reaction of at least one test chemical contained in the test element, wherein the second part is movable relative to the first part, wherein the receptacle is configured to position the second part such that a test element may be inserted into the receptacle and to subsequently position the second part in a closed position such that at least one abutment surface of the second part rests on the test element.
Core Innovation
A test element analysis system is described for the analytical examination of a sample. The system includes a measurement device with a test element receptacle configured to receive at least one test element, wherein the test element receptacle comprises a first part with at least one support surface and a second part with at least one optical detector for detecting at least one detection reaction of at least one test chemical contained in the test element.
The second part is movable relative to the first part and is positioned in at least one position to allow a test element to be inserted into the test element receptacle and subsequently positioned in a closed position. In the closed position, at least one abutment surface of the second part rests on the test element, and an actuator drives a relative movement of the first part and the second part by performing a predetermined sequence of movements that sequentially brings the second part into at least two positions, including a defined stopping in one of the positions.
After the second part rests on the test element, the actuator is configured to decouple as soon as the second part rests on the test element, so that a contact pressure is defined by the weight of the second part. The second part is moveable relative to the first part in a direction essentially perpendicular to the support surface, and the second part further comprises at least one alignment pin for engagement with at least one alignment hole of the test element.
The movable second part carrying the optical detector is structured so optical focus is maintained by placing the abutment surface or reference surface in the lens focal plane or an essentially ideal object plane. The receptacle is implemented with alignment pins, holes, and guidance elements such that reliable optical detection is enabled when the abutment surface rests on the test element in the closed position.
Claims Coverage
The document provides two independent claims: one directed to a test element analysis system and one directed to a method for analytical examination. Across these independent claims, at least two main inventive features recur: a movable, multi-position test element receptacle with an optical detector and abutment surface engagement, and an actuator sequence with decoupling to define contact pressure by the weight of the movable part, including alignment via pin and hole engagement.
Movable test element receptacle with optical detector detecting detection reaction
A measurement device comprising a test element receptacle for receiving at least one test element, where the test element receptacle comprises at least one first part with at least one support surface and at least one second part with at least one optical detector for detecting at least one detection reaction of at least one test chemical contained in the test element, and where the second part is movable relative to the first part.
Actuator performs predetermined sequence to open and close with abutment surface resting on the test element
The test element receptacle is configured to position the second part in at least one position such that a test element may be inserted into the test element receptacle and to subsequently position the second part in a closed position such that at least one abutment surface of the second part rests on the test element, wherein the system further comprises at least one actuator for driving a relative movement of the first part and the second part, with the actuator configured for performing a predetermined sequence of movements sequentially bringing the second part into at least two positions and stopping the movement in one of the at least two positions.
Decoupling defines contact pressure by weight of second part
The actuator is configured to move the second part towards the first part and to decouple as soon as the second part rests on the test element, wherein due to the decoupling of the actuator a contact pressure is defined by a weight of the second part.
Alignment pin and alignment hole engagement
The second part further comprises at least one alignment pin for engagement with at least one alignment hole of the test element.
Method steps: position for insertion, insert, then close to rest abutment surface
A method for analytical examination comprising providing a measurement device having a test element receptacle with first part and second part including optical detector and alignment pin, using an actuator for performing a predetermined sequence with decoupling as soon as the second part rests on the test element, positioning the second part in a position such that a test element may be inserted, inserting the test element into the test element receptacle, and closing the test element receptacle such that at least one abutment surface rests on the test element.
Across the independent claims, the core claim coverage centers on a movable, multi-part test element receptacle that uses an optical detector to detect a detection reaction of a test chemical, with open and closed positioning achieved by an actuator-driven predetermined sequence. The claims further require decoupling to define contact pressure by the weight of the movable part and include alignment via an alignment pin engaging an alignment hole.
Stated Advantages
Enables reliable optical detection by maintaining defined contact and mechanical behavior when the abutment surface rests on the test element.
Allows a fixed optical detector-to-test-field distance independent of test-strip thickness by maintaining focus via placement of the abutment or reference surface in the lens focal plane or essentially ideal object plane.
Improves optical detection timing by being out of focus after insertion and in focus after closing.
Documented Applications
Analytical examination of a sample using a test element with an optically detectable detection reaction of a test chemical contained in the test element.
A method for analytical examination of a sample using a measurement device with a movable test element receptacle and optical detection.
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