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Publication Number
US-11371948-B2
Publication Date
2022-06-28
Expiration Date
Abstract
The present specification discloses a multi-view X-ray inspection system having, in one of several embodiments, a three-view configuration with three X-ray sources. Each X-ray source rotates and is configured to emit a rotating X-ray pencil beam and at least two detector arrays, where each detector array has multiple non-pixellated detectors such that at least a portion of the non-pixellated detectors are oriented toward both the two X-ray sources.
Core Innovation
The invention provides an X-ray inspection system for scanning an object using at least two X-ray sources that simultaneously emit X-ray beams along respective emission paths. A first scatter detector array is placed on a same side of the inspection system as a first X-ray source, and a second scatter detector array is placed on a same side as a second X-ray source. The system includes at least one controller that controls the X-ray sources in a coordinated manner so that the X-ray beams do not cross emission paths.
The invention also coordinates source scanning so the beams operate in a coordinated, non-overlapping manner, including simultaneous scanning where the emission paths of each X-ray beam does not cross. In refined configurations, the X-ray beams may be pencil beams emitted by at least two rotating X-ray sources that rotate through a predetermined angle. The system can use non-crossing, coordinated scan directions to address cross talk among the sources.
In further refined aspects, the detector implementation can include scatter detectors and backscatter detectors configured to detect backscattered X-rays emitted by respective ones of the at least two X-ray sources placed on a first side of the object. Optional detector array layouts include backscatter detectors and a transmission detector arranged in a single plane facing the scanned object, with the transmission detector placed between backscatter detectors. The controller can also support additional detection modes, including gamma-ray detection by turning off at least two X-ray sources and switching at least one scatter detector array from current integrating mode to pulse counting mode.
Claims Coverage
The document contains two independent claims (clm-00001 and clm-00012). Across these independent claims, the main inventive features are coordinated multi-source scanning with non-crossing (non-overlapping) emission paths, and dedicated detector array placement to detect scatter/backscatter from respective sources, including configurations that support concurrent scanning and optional transmission detection within the detector array.
Coordinated non-crossing multi-source emission paths
At least two X-ray sources configured to simultaneously emit X-ray beams, wherein each of the X-ray beams defines an emission path, and at least one controller controls each X-ray source to scan the object in a coordinated manner such that the X-ray beams of the at least two X-ray sources do not cross emission paths.
Scatter detector arrays placed by source side
A first scatter detector array placed on a same side of the inspection system as a first of the at least two X-ray sources; and a second scatter detector array placed on a same side of the inspection system as a second of the at least two X-ray sources.
Coordinated non-overlapping concurrent scanning
At least one controller controlling each of the at least two X-ray sources to concurrently scan the object in a coordinated, non-overlapping, manner such that the emission paths of each of said X-ray beams does not cross.
Backscatter detector array linked to respective sources
A detector array comprising at least two backscatter detectors, wherein each of said backscatter detectors detects backscattered X-rays emitted by a first of the at least two X-ray sources placed on a first side of the object.
Overall claim coverage centers on scanning an object with simultaneously emitting at least two X-ray sources while using coordinated controller control to prevent emission paths from crossing, combined with detector arrays (scatter/backscatter) positioned so each detector array detects scatter/backscatter associated with respective sources on specified sides of the inspection system.
Stated Advantages
Reduces cross talk by scanning with non-overlapping, coordinated emission paths that do not cross.
Enables gamma-ray detection by turning off X-ray sources and switching detector operation from current integrating mode to pulse counting mode.
Documented Applications
Multi-view cargo/vehicle inspection concepts, including deployment for a gantry with an inspection tunnel and a mobile inspection vehicle with boom stow/deploy.
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