Infra-red spectroscopy system
Inventors
Baker, Matthew J. • Hegarty, Mark • Butler, Holly Jean • Palmer, David
Assignees
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Publication Number
US-11215553-B2
Publication Date
2022-01-04
Expiration Date
Abstract
A sample slide (100) for use in a spectrometer (501), wherein the sample slide comprises a plurality of sample-receiving portions (111-114) provided on a sample side (115) of the slide, and a plurality of beam-receiving portions (121-124) provided on a beam-receiving side (125) of the slide, each beam-receiving portion being arranged opposite a respective sample-receiving portion, and wherein each beam-receiving portion is configured to act as an internal reflection element (IRE). A device (300) for use with a spectrometer (501) comprises a stage (330) configured to receive a sample slide (100); and a moving mechanism (360) configured to move the sample slide relative to a sample-measuring location (320) of the device. Associated methods for preparing a sample and measuring a sample are also disclosed.
Core Innovation
The invention provides a disposable sample slide for infra-red spectroscopy using ATR-FTIR, where a plurality of sample-receiving portions are provided on a sample side and a plurality of beam-receiving portions are provided on a beam side. Each beam-receiving portion is arranged opposite a respective sample-receiving portion and each beam-receiving portion comprises an internal reflection element. A thickness between each beam-receiving portion and each opposite sample-receiving portion is selected from 380 μm, 525 μm, and 675 μm.
The slide includes slide/well geometries with grooves and/or prisms, where adjacent grooves are aligned or parallel and adjacent prisms are aligned or parallel. Infrared-transmissible materials for the internal reflection element include silicon to reduce cost, as well as other infrared-transmissible materials. The slide is arranged relative to an ATR accessory such that the beam-receiving portions function as internal reflection elements at a sample-measuring location.
A device and associated method are provided to sequentially analyse, measure, or detect a plurality of samples disposed on the sample receiving portions without removing, cleaning, or drying the internal reflection element between measurements. The device includes a stage configured to receive the sample slide and a moving mechanism configured to move the sample slide relative to a sample-measuring location. The description further reports that drying conditions influence spectral reproducibility and peak sharpness/intensity.
Claims Coverage
The document provides four independent claims covering a disposable multi-portion sample slide for ATR-FTIR, a device with a stage and moving mechanism to align multiple slide portions with a sample-measuring location, a method for sequentially analysing samples on the slide, and a method for preparing samples for IR spectral analysis by drying on the slide with defined conditions. Each independent claim includes core structural alignment of sample-receiving and beam-receiving portions with internal reflection elements and selected slide thickness values of 380 μm, 525 μm, or 675 μm.
Multi-portion slide with opposing IRE beam portions
A sample slide comprising a plurality of sample-receiving portions on a sample side and a plurality of beam-receiving portions on a beam side, each beam-receiving portion arranged opposite a respective sample-receiving portion and each beam-receiving portion comprising an internal reflection element.
Selected slide thickness between opposed portions
A thickness between each of the plurality of beam-receiving portions and each of the opposite respective sample-receiving portions selected from 380 μm, 525 μm, and 675 μm.
Stage with slide support and a moving mechanism to align with measurement location
A device comprising a stage configured to receive a sample slide having a plurality of sample-receiving portions on a sample side and a plurality of beam-receiving portions on a beam side, each beam-receiving portion comprising an internal reflection element, and a moving mechanism configured to move the sample slide relative to a sample-measuring location.
Sequential movement for analyzing multiple disposed samples
A method for measuring a sample comprising placing a sample slide on a stage coupled to a spectrometer and moving the sample slide relative to a sample-measuring location so as to sequentially analyse, measure or detect a plurality of samples disposed on the sample receiving portions.
Drying one or more samples on an IRE slide with defined thickness and conditions
A method of preparing a sample for IR spectral analysis comprising drying one or more samples on a sample slide having a plurality of sample-receiving portions on a sample side and a plurality of beam-receiving portions on a beam side with each beam-receiving portion comprising an internal reflection element, the slide having a thickness selected from 380 μm, 525 μm and 675 μm, at a temperature of approximately 30-36 °C and/or under a gas flow rate of at least 50 m3/h.
Across the independent claims, the main inventive coverage is directed to multi-portion sample slides having opposing sample-receiving portions and beam-receiving portions that include an internal reflection element, using selected thickness values of 380 μm, 525 μm, or 675 μm. The coverage further extends to a device with a stage and moving mechanism for relative motion to a sample-measuring location, measurement by sequentially analysing multiple samples disposed on the slide, and sample preparation by drying on the same slide under defined temperature and/or gas-flow conditions.
Stated Advantages
Enables sequential analysis, measurement, or detection of a plurality of samples disposed on the sample receiving portions using a moving mechanism relative to a sample-measuring location.
Improves spectral reproducibility and peak sharpness/intensity through optimized drying conditions.
Supports differentiation of targets using multivariate analysis including principal component analysis.
Reduces cost by using silicon as an internal reflection element material.
Documented Applications
Differentiating cancer targets using ATR-FTIR data processing and principal component analysis, including GBM serum and melanoma serum.
Differentiating other biological targets using ATR-FTIR data processing and principal component analysis, including bacteria classification.
High-throughput analysis of multiple samples disposed on the slide, using sequential alignment with a sample-measuring location without removing, cleaning, or drying the internal reflection element between measurements.
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