Counterfeit microelectronics detection based on capacitive and inductive signatures
Inventors
Hamilton, Brett J. • Howard, Andrew M.
Assignees
Publication Number
US-10685144-B2
Publication Date
2020-06-16
Expiration Date
2035-02-05
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Abstract
Systems and methods for detecting counterfeit integrated circuits are provided. One exemplary embodiment of a method can include: providing an integrated circuit for testing; and characterizing capacitive and inductive loading of the integrated circuit power for a specified frequency range; wherein the characterizing step further comprises applying a low level alternating current to a power pin while measuring for capacitance characterization conditions created by the integrated circuit's internal capacitance and inductance responses, wherein by sweeping the alternating current signal across a specified frequency range one or more capacitance related device signature can be created and used to identify a component as originating from a trusted source or not. A system can include components and machine readable instructions for operating the components using exemplary methods. Exemplary embodiments can include automated systems that can also be used with the device signature on a production line or in a supply chain verification location.
Core Innovation
The invention provides systems and methods for detecting counterfeit integrated circuits by characterizing capacitive and inductive loading of an integrated circuit's power pin across a specified frequency range. This characterization involves applying a low level alternating current to the power pin and measuring conditions created by the IC's internal capacitance and inductance, resulting in capacitance related device signatures. These signatures can be analyzed to determine if a component originates from a trusted source or not.
The problem addressed arises from the limitations of conventional counterfeit detection methods, which include costly and time-consuming specification-based electrical testing, limited effectiveness against die substitutions that meet manufacturer specifications, and challenges in screening older or out-of-production devices without sufficient 'Golden Device' data. Existing methods often rely on I/O pin current-to-voltage curve comparisons that do not adequately account for manufacturing variations or produce comprehensive evaluations. Physical characteristic analyses are ineffective for enclosed dies, and full electrical testing is not timely or sufficient for detecting certain counterfeits.
This invention introduces a major shift in testing paradigms by employing impedance measurement techniques on the power pin to capture capacitive and inductive signatures. The method is easier to implement, faster to execute, cost-effective, and effective for detecting various counterfeit scenarios including die substitutions and misrepresented states. By exploiting subtle manufacturing differences inherent between foundries and lots, distinct device signatures can be produced, enabling reliable authentication of integrated circuits.
Claims Coverage
The patent includes one independent claim covering a system for detecting counterfeit or mischaracterized integrated circuits with several innovative features.
Capacitance analyzer configured to measure capacitance data at multiple frequencies
A capacitance analyzer operable to supply an electrical signal and measure multiple capacitance measurements at different frequencies within a specified range, generating a capacitance curve plot based on the measured data.
Fixture coupling analyzer to devices under test power pins
A fixture adapted to couple the capacitance analyzer to the power pins and ground pins of first and second integrated circuits under test to separately apply electrical signals and acquire capacitance data.
Determination and storage of capacitance device signature based on resonance or zero slope detection
The system determines a capacitance device signature comprising one or more measured capacitance data points at specific frequencies, selected based on detection of resonance transitions within the data or regions where the capacitance curve has a slope closest to zero.
Comparison of device signatures and determination of match or no-match
The system compares the capacitance device signature data from a first device with capacitance data from a second device under test to determine whether there is a match or no-match, indicating authenticity or counterfeit status.
Output configured to display or record match results
The system includes input and output sections configured to output the determined match or no-match results via display, data output, or recording medium.
Overall, the claims define a system that utilizes capacitance measurements over frequency sweeps at power pins, capturing distinctive device signatures through resonance detection or slope analysis, and comparing those signatures across devices to detect counterfeit or mischaracterized integrated circuits with data output capabilities.
Stated Advantages
Easier implementation compared to full specification electrical testing.
Rapid execution enabling timely counterfeit screening.
Effective detection of dielectric substitutions and various counterfeit classes including misrepresentation as new or correct manufacturer.
Cost-effectiveness relative to expensive and time-consuming traditional testing methods.
Ability to differentiate devices from different foundries and manufacturing lots based on subtle impedance differences.
Documented Applications
Automated systems for counterfeit integrated circuit detection usable on production lines or in supply chain verification locations.
Screening suspect microelectronics including detection of counterfeit, defective, or misrepresented integrated circuits using power pin capacitive and inductive signatures.
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