IC device authentication using energy characterization
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Publication Number
US-10585139-B1
Publication Date
2020-03-10
Expiration Date
Abstract
Systems, methods, and apparatuses are described for verifying the authenticity of an integrated circuit device. An integrated test apparatus may use quiescent current and/or conducted electromagnetic interference readings to determine if a device under test matches the characteristics of an authenticated device. Deviations from the characteristics of the authenticated device may be indicative of a counterfeit device.
Core Innovation
The invention provides an IC device authentication system that characterizes an unauthenticated IC device by determining quiescent current (QC) measurements and comparing the measured QC characteristics to expected QC values associated with an authenticated IC device. A first voltage is applied to the unauthenticated IC device, a first quiescent current reading is determined, and a tested QC value is derived from the first QC reading. An r-squared value is determined based at least in part on a difference between the tested QC value and the expected QC value, and a threshold is evaluated to determine whether the threshold is not satisfied.
The invention further characterizes the unauthenticated IC device using conducted electromagnetic interference (conducted EMI) measurements associated with an authenticated IC device baseline. A steady-state voltage is applied to the unauthenticated IC device, and while applying the steady-state voltage, an excitation signal is applied to an input of the unauthenticated IC device. A high frequency signal is detected on a Vcc connection, and based on the high frequency signal, a tested conducted EMI value is determined. The tested conducted EMI value is compared to an expected conducted EMI value associated with an authenticated IC device to determine that a threshold is not satisfied and to output an indication.
In one described embodiment, an analog energy calculation approach is used to yield a single DC scalar EMI energy value proportional to conducted EMI energy, using high-pass filtering, preamplification, wideband analog squaring, and a lossy integrator. A QC compression amplifier circuit is also described to capture wide-range QC behavior, supporting decision logic that uses r-squared values for QC variability and compares QC and EMI results to tolerances or thresholds.
Claims Coverage
The independent claims include three distinct method categories: QC-based evaluation with r-squared, conducted EMI-based evaluation using detection on a Vcc connection, and a combined QC-and-EMI threshold evaluation outputting an indication when one or both thresholds are not satisfied. Across these independent claims, the key inventive features center on threshold-based comparisons to expected values associated with an authenticated IC device and outputting an indication when thresholds are not satisfied.
Quiescent current (QC) r-squared threshold authentication
Applying a first voltage to an unauthenticated IC device; determining, using the first voltage, a first quiescent current (QC) reading; determining, based on the first QC reading, a tested QC value; determining, based at least in part on a difference between the tested QC value and an expected QC value, an r-squared value associated with an authenticated IC device; determining, based at least in part on the r-squared value, that a threshold is not satisfied; and outputting an indication that the threshold is not satisfied.
Conducted electromagnetic interference (EMI) threshold authentication using Vcc high-frequency signal
Applying a steady-state voltage to an unauthenticated IC device; applying, while applying the steady-state voltage, an excitation signal to an input of the unauthenticated IC device; detecting, based on the applied steady-state voltage and the applied excitation signal, a high frequency signal on a Vcc connection of the unauthenticated IC device; determining, based on the high frequency signal, a tested conducted electromagnetic interference (EMI) value; determining, based on a difference between the tested conducted EMI value and an expected conducted EMI value associated with an authenticated IC device, that a threshold is not satisfied; and outputting an indication that the threshold is not satisfied.
Combined QC-and-conducted EMI dual-threshold indication for authentication
Determining, based at least in part on a difference between a tested quiescent current (QC) value associated with an unauthenticated IC device and an expected QC value associated with an authenticated IC device, that a first threshold is not satisfied; determining, based on detecting a high frequency signal on a Vcc connection of the unauthenticated IC device, a tested conducted electromagnetic interference (EMI) value; determining, based on a difference between the tested conducted EMI value and an expected conducted EMI value associated with an authenticated IC device, that a second threshold is not satisfied; and outputting, based on determining that at least one threshold of the first threshold or the second threshold is not satisfied, an indication that the at least one threshold is not satisfied.
Across the independent claims, authentication is performed by comparing tested QC and/or tested conducted EMI characteristics of an unauthenticated IC device to expected values associated with an authenticated IC device. The comparisons are evaluated against one or more thresholds, and an indication is output when one or more thresholds are not satisfied.
Stated Advantages
Outputs an indication that a threshold is not satisfied for an unauthenticated IC device.
Enables authentication based on comparing tested QC and/or tested conducted EMI characteristics of an unauthenticated IC device to expected values associated with an authenticated IC device.
Supports pass/fail style indication and potential counterfeit device indication when thresholds are not satisfied.
Documented Applications
IC device verification and testing that characterizes an unauthenticated IC device and outputs a counterfeit device indication when threshold conditions are not satisfied.
Integrated test apparatus operation for IC device authentication and testing using quiescent current (QC) characterization and conducted EMI energy measurements.
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