System for image reconstruction using a known pattern

Inventors

LESHEM, Ben • Hayut, Itai • Na'aman, Erez • SMALL, Eran

Assignees

Scopio Labs Ltd

Abstract

Disclosed herein are systems and methods for constructing an image of a sample using a plurality of images acquired under multiple illumination conditions. In some cases, a microscope may include an image capture device, an illumination assembly, and a processor configured to acquire a plurality of images of a sample and a fiducial marker under a plurality of different illumination conditions and to reconstruct a high resolution image in response to the plurality of images. The disclosure also provides a method for generating a high resolution image of a sample comprising acquiring a plurality of images of a sample and a fiducial marker under a plurality of different illumination conditions and reconstructing the high resolution image in response to the plurality of images.

Core Innovation

The invention describes a microscope for generating a high resolution image of a sample. The microscope includes an illumination assembly, an image capture device, a fiducial marker imaged with the image capture device, and a processor coupled to the illumination assembly and the image capture device. The processor acquires a plurality of images of the sample and the fiducial marker under a plurality of different illumination conditions, including at least one brightfield image comprising the fiducial marker.

The high resolution image is generated by reconstructing in response to the fiducial marker and the plurality of images using the brightfield image comprising the fiducial marker in the reconstruction. The disclosed reconstruction uses the fiducial marker and known spatial-frequency and pattern information associated with the fiducial marker to generate the high resolution image. The marker supports reconstruction based on marker attributes derived through frequency-domain transformations, including Fourier transform and FFT/DFT, and may additionally use Hadamard, discrete cosine, Walsh-Hadamard, Haar, and Slant transformations.

The document further describes microscope implementations with an illumination assembly, image capture device or sensors, a processor, and focus actuator or stage functionality, with fiducial marker placement on or near slides, coverslips, or stage. Example marker configurations include 1D or 2D periodic patterns and delta-function arrays or diffraction gratings. The processing flow includes acquiring the plurality of images, performing Fourier-plane aggregation, and performing an inverse transform reconstruction to obtain the reconstructed high resolution image, which is presented as a brightfield image.

Claims Coverage

The claim coverage identifies 4 inventive features. The independent claim defines a microscope architecture and reconstruction workflow using a fiducial marker present in a plurality of images under different illumination conditions, including brightfield use in the reconstruction.

Across the independent claim and its dependent refinements, the inventive concept is grounded in acquiring multiple images containing both the sample and an imaged fiducial marker under different illumination conditions, including brightfield, and reconstructing a brightfield high resolution image based on the fiducial marker. Additional refinements specify a resolution relationship and optionally constrain reconstruction to a non-iterative mode.

Stated Advantages

Documented Applications