System and method for physically detecting counterfeit electronics
Inventors
Keller, III, Walter J. • Freeman, Stephen Dorn • Galyardt, Jason
Assignees
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Publication Number
US-10475754-B2
Publication Date
2019-11-12
Expiration Date
Abstract
A system for inspecting or screening electrically powered device includes a signal generator inputting a preselected signal into the electrically powered device. There is also an antenna array positioned at a pre-determined distance above the electrically powered device. Apparatus collects RF energy emitted by the electrically powered device in response to input of said preselected signal. The signature of the collected RF energy is compared with an RF energy signature of a genuine part. The comparison determines one of a genuine or a counterfeit condition of the electrically powered device.
Core Innovation
The described invention inspects or screens a discrete semiconductor or an integrated circuit for counterfeits by using a high precision signal source to generate a high precision oscillator signal that drives at least one of a signal input and a clock input. In response to the driven inputs, the system collects electromagnetic energy in a radio frequency (RF) spectrum emitted by the discrete semiconductor or integrated circuit using a receiver coupled to an antenna. A processor executes at least one algorithm to determine, by comparing emission signature characteristics of the collected electromagnetic energy against baseline RF emission signature characteristics, whether the device is genuine or counterfeit.
The invention further addresses detection of counterfeited integrated circuits and devices employing the integrated circuit by generating a high precision oscillator signal with frequency consistent with input requirements and driving at least one of a signal input and a clock input of the powered integrated circuit and the device. An RF collection means positioned in proximity to the integrated circuit or device receives radiated emissions driven by the high precision oscillator signal, and a processor processes a signature of the radiated emission and compares it against predetermined emission signatures to define genuine conditions.
For semiconductor devices installed on a printed circuit board assembly, the invention includes automated robotic movement across different locations of the printed circuit board assembly while injecting the high precision oscillator signal into the board. RF emissions emitted by the semiconductor devices are received using an antenna array that includes a low noise amplifier and is coupled to a receiver, and processors inspect and screen based on comparing received emission signatures against baseline characteristics. In certain configurations, an active illumination source illuminates the semiconductor device with free field RF energy to enhance the emissions signature, and baseline establishment uses local spectral power density statistics and localized statistical features.
In method claims, the invention differentiates counterfeit and genuine semiconductor based devices by injecting a high precision oscillator signal through at least one of a clock input and a signal input, collecting emissions radiated in response, and comparing emission characteristics against baseline RF characteristics of a genuine semiconductor based device. Certain methods repeat generating, injecting, and collecting with different frequency settings or with identical settings, and in other cases use narrow-band RF emissions for further inspection relative to wideband RF emission responses.
Claims Coverage
Independent claims are directed to systems, apparatuses, and methods that drive semiconductor inputs with a high precision oscillator signal, collect RF emissions with RF collection means, and compare emission signatures against baseline or predetermined genuine signatures. The claims also include robotic inspection on printed circuit board assemblies, an antenna array with low noise amplifier, active free-field RF illumination, repeated inspection patterns, and baseline establishment using localized statistical features.
High precision oscillator driven RF emission inspection with baseline signature comparison
A system for inspecting or screening a discrete semiconductor or an integrated circuit for counterfeits comprising a high precision signal source configured to generate a high precision oscillator signal for driving at least one of a signal input and a clock input; a receiver coupled to an antenna and configured to collect electromagnetic energy in an RF spectrum emitted by the discrete semiconductor or integrated circuit in response; and a processor executing at least one algorithm to determine, based on comparison of emission signature characteristics against baseline RF emission signature characteristics, one of a genuine or a counterfeit condition.
High precision oscillator input with proximity RF collection and predetermined signature matching
An apparatus detecting at least one of a counterfeited integrated circuit and a counterfeited device employing the integrated circuit, comprising a high precision signal source configured to generate a high precision oscillator signal for driving at least one of a signal input and a clock input of a powered integrated circuit and the device, with frequency consistent with input requirements; an RF collection means comprising a receiver and an antenna positioned in proximity and configured to receive emissions radiated by the integrated circuit and the device driven with the high precision oscillator signal; and a processor configured to process a signature of the radiated emission and compare it against at least one emission signature predetermined to define at least one of a genuine integrated circuit and a genuine device.
Counterfeit differentiation by injecting high precision oscillator signals into semiconductor inputs and comparing to baseline genuine RF characteristics
A method differentiating between a counterfeit and a genuine semiconductor based device comprising generating a high precision oscillator signal with a high precision signal source; injecting the high precision oscillator signal through at least one of a clock input and a signal input; collecting with an RF collection means comprising a receiver and an antenna emissions in response; comparing characteristics of the RF emissions against baseline RF characteristics of a genuine semiconductor based device; and determining based on the comparison whether the device is counterfeit or genuine.
Robotic printed circuit board inspection with low-noise antenna array and signature comparison
An apparatus for at least one of inspecting and screening at least one semiconductor based device installed on a printed circuit board assembly comprising a robotic arm; a controller controlling movement over different locations; a high precision signal source generating a high precision oscillator signal for injection; an antenna array including a low noise amplifier integrated therewithin; a receiver connected to the antenna array configured to receive emission radiated by the semiconductor based device injected with the high precision oscillator signal; and at least one processor coupled to the receiver configured to inspect and screen based on comparison of a signature against baseline characteristics.
Single high precision oscillator signal inspection system
A system for inspecting or screening for counterfeits of an electrical or electronic device comprising a high precision oscillator signal source configured for inputting one and only one high precision oscillator signal into the electrical or electronic device through at least one of a signal input and a clock input; means for collecting RF energy emitted by the device in response; and means for determining, based on comparison of characteristics of the collected RF energy against baseline RF characteristics, a genuine or a counterfeit condition.
Repeating counterfeit differentiation with different frequency settings and individual versus simultaneous input injection comparisons
A method differentiating between a counterfeit and genuine semiconductor based device comprising generating a high precision oscillator signal; injecting the high precision oscillator signal into a semiconductor through at least one of a clock input and a signal input; collecting emissions in response; comparing the characteristics against baseline RF characteristics of a genuine semiconductor; determining the device as counterfeit or genuine based on the comparison; and repeating steps with different frequency settings injected into at least two inputs and comparing RF collection data for each high precision oscillator signal injected individually to expected signature and injection into all inputs simultaneously.
Printed circuit board apparatus with active free-field RF illumination to enhance emissions signature
An apparatus for at least one of inspecting and screening at least one semiconductor based device installed on a printed circuit board assembly comprising a robotic arm; a controller controlling movement over different locations; a high precision signal oscillator source generating a high precision oscillator signal for injection; an antenna array comprising a low noise amplifier; a receiver connected to the antenna array configured to receive emission radiated by the semiconductor based device injected with the high precision oscillator signal; at least one processor coupled to the receiver configured to inspect and screen; and an active illumination source configured to illuminate the semiconductor based device with free field RF energy to enhance the emissions signature.
Baseline establishment using local spectral power density statistics and localized statistical features
A method differentiating between a counterfeit and a genuine semiconductor based device comprising generating a high precision oscillator signal with a high precision signal source; injecting the high precision oscillator signal into a semiconductor based device through at least one of a clock input and a signal input; collecting emissions in response; comparing characteristics of the RF emissions against baseline RF characteristics of a genuine semiconductor based device where establishing baseline comprises obtaining local spectral power density statistics by sampling a plurality of semiconductor based devices and discriminating the plurality based on localized statistical feature measured on emissions common between sampled devices, the localized statistical feature comprising at least one of Emission Frequency Location, Emission Peak Magnitude, Emission Phase Noise, Emission Symmetry, Skewness, and Emission Local Noise Floor; and determining counterfeit or genuine based on the comparison.
Repeating inspection with identical oscillator settings
A method for differentiating between a counterfeit and a genuine semiconductor based device comprising generating a high precision oscillator signal with a high precision signal source; injecting the high precision oscillator signal into the semiconductor based device through at least one of a clock input and a signal input; collecting emissions in response with an RF collection means; repeating steps with identical settings on the high precision oscillator signal injected into the semiconductor based device; comparing characteristics of the RF emissions collected against baseline RF characteristics of a genuine semiconductor based device; and determining based on the comparison whether the device is counterfeit or genuine.
Narrow-band RF emissions used in further inspection relative to wideband RF responses
A method differentiating between a counterfeit and a genuine semiconductor based device comprising generating a high precision oscillator signal; injecting the high precision oscillator signal into a semiconductor based device through at least one of a clock input and a signal input; collecting emissions in response; repeating steps with identical settings; comparing characteristics of the RF emissions collected against baseline RF characteristics of the genuine semiconductor based device; determining based on the comparison whether the device is counterfeit or genuine; and using narrow-band RF emissions for further inspection and comparison of RF emission signatures observed in wideband RF emission responses.
Across the independent claims, the core inventive structure is driving semiconductor inputs with a high precision oscillator signal, collecting corresponding RF electromagnetic emissions via receiver/antenna proximity or antenna arrays, and determining genuine versus counterfeit by comparing emission signature characteristics against baseline or predetermined genuine emission signatures. Additional distinctions include selection of specific oscillator source types, restriction to a single oscillator signal, robotic inspection over printed circuit board assembly locations, active free-field RF illumination to enhance emissions signature, controlled repetition patterns, and baseline establishment using local spectral power density statistics and localized statistical features, as well as use of narrow-band RF emissions for further inspection relative to wideband responses.
Stated Advantages
Not explicitly described in patent.
Documented Applications
Not explicitly described in patent.
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