Electronic device monitoring using induced electromagnetic emissions from software stress techniques

Inventors

Sternberg, OrenRockway, John D.Lerner, MitchellPerez, Israel

Assignees

US Department of Navy

Publication Number

US-10372587-B1

Publication Date

2019-08-06

Expiration Date

2036-11-09

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Abstract

A method involves using one or more software programs to stress a powered electronic device in a test environment to induce controlled electromagnetic emissions from the powered electronic device, using the controlled electromagnetic emissions to generate an emission profile of the powered electronic device operating under stress, monitoring spurious electromagnetic emissions of the powered electronic device in an operational environment, and comparing the spurious electromagnetic emissions of the powered electronic device in the operational environment with the emission profile of the powered electronic device to determine that the powered electronic device is operating under stress in the operational environment.

Core Innovation

The invention involves using one or more software programs to stress a powered electronic device in a test environment to induce controlled electromagnetic emissions from it. These emissions are then used to generate an emission profile of the device operating under stress. Subsequently, spurious electromagnetic emissions of the device in an operational environment are monitored and compared with this emission profile to determine if the device is operating under stress.

The problem being addressed is the need for systems and methods to defend against new types of attacks on embedded devices that are now frequently linked with software control and diagnostics. This requires understanding unwanted signal generation and how to control it to detect stress or attacks on such powered electronic devices.

Claims Coverage

The patent contains three independent claims covering methods and a system for monitoring and detecting stress in powered electronic devices using induced electromagnetic emissions.

Inducing and profiling electromagnetic emissions via software stress

Using one or more software programs installed on a computer to stress a powered electronic device in a test environment to induce a repeatable sequence of controlled electromagnetic emissions and generating an emission profile of the device operating under stress.

Monitoring and comparing emissions to detect stress or attacks

Monitoring spurious electromagnetic emissions of the powered electronic device in an operational environment and comparing these emissions with the previously generated emission profile to determine if the device is under stress or undergoing an attack, and alerting a user accordingly.

System for emission detection and alerting

A system comprising a powered electronic device, an electromagnetic probe separated by an air gap collecting spurious emissions, and a computer with an emission profile stored. The computer monitors emissions in an operational environment, compares detected emissions to the profile, and triggers an alert if stress due to an attack is detected.

The independent claims cover a method to induce, profile, monitor, and compare controlled electromagnetic emissions from a powered electronic device to detect stress or attacks, and a system built to perform these functions and alert users accordingly.

Stated Advantages

Provides repeatable measurements of embedded devices through software-induced controlled electromagnetic emissions to diagnose device stress.

Enables detection of device operating conditions remotely by monitoring spurious emissions, thus assisting in security and diagnostic applications.

Allows system designers to understand and reduce emission leakage vulnerabilities, potentially improving system design and power consumption.

Assists software programmers in evaluating how new or upgraded software affects device component stress and energy usage by comparing emission profiles.

Documented Applications

Using software diagnostic tools to stress embedded devices and generate emission profiles for differentiating normal operation from unwanted attacks or stress.

Employing controlled electromagnetic emissions as a diagnostic tool to monitor and determine if embedded devices are operating under stress in operational environments.

Aiding system designers to analyze emission leakage pathways and redesign systems to prevent emission leakage and reduce power consumption.

Helping software programmers assess the impact of new or upgraded software on system components and energy through comparison of induced emission profiles.

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